NIST traceable based uncertainty is only the beginning of the expanded Bayesian based metrology

Josh D. Lee is a Vinita, Oklahoma based criminal defense attorney. He is nationally recognized as a lawyer-scientist for his expertise on forensic science related topics. He has lectured well over 100 times in 18 diﬀerent states.

Mr. Lee has been invited to lecture at the American Chemical Society (ACS) as well as the American Academy of Forensic Science (AAFS). In 2011, Josh was elected Forensic Science Co-Chairman for the Chemistry and the Law Division of the ACS. He is also an “Assistant Chromatography Instructor” for the ACS.

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NIST traceable based uncertainty is only the beginning of the expanded Bayesian based metrology

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